Method and instrument with probe for measuring inn

专利名称：Method and instrument with probe for

measuring inner or outer dimension of anobject

发明人：Ohtsuka, Yukiharu,Saruki, Yoshio,Moriya,

Yoshio

申请号：EP98108184.7申请日：19980505公开号：EP0877224A3公开日：19990414

专利附图：

摘要：A body 1 placed thereon with a table 35 put thereon with an object to be

measured W, and a portal frame 41 supporting both ends of rail 43 to the body throughpillars 42A and 42B, the rail being placed above the table 35 and extending along amoving direction of a pair of probes 91A and 91B, are provided. A pair of sliders 51A and51B are movably supported by the rail 43. The pair of the probes are extended

downward from the sliders 51A and 51B to be abutted to the object W put on the table35. The flexural deformation of the probes 91A and 91B is decreased due to the shorterlength of the probes 91A and 91B, so that the high accurate measurement is achievedand a relative measurement is omitted.

申请人：Mitutoyo Corporation

地址：20-1, Sakado 1-chome, Takatsu-ku Kawasaki-shi, Kanagawa-ken 213-0012 JP

国籍：JP

代理机构：Hoffmann, Eckart, Dipl.-Ing.

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