专利名称:Integrated circuits
发明人:Knight, William Laurence,Paraskeva,
Mark,Burrows, David Frank
申请号:EP85308852.4申请日:19851205公开号:EP01951A1公开日:19860924
专利附图:
摘要:An integrated circuit having a built-in self test facility, the integrated circuitbeing partitioned into a number of sub-circuits each of which comprises a combinatoriallogic circuit (CLB) and a register (RB). The sub-circuits are coupled together so that each
combinatorial logic circuit (CLB) has its inputs coupled to at least one register (RB), has itsoutputs coupled to at least one register (RB), and the output of the overall integratedcircuit is taken from one or more registers (RB). Each register (RB) has its functional modecontrolled by predetermined signals to an associated local decoder, the functionalmodes of the registers (RB) being selected to initiate a test operation for the testing ofthe integrated circuit.
申请人:PLESSEY OVERSEAS LIMITED
地址:Vicarage Lane Ilford Essex IG1 4AQ GB
国籍:GB
代理机构:Fish, Norman Ernest
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