Method and apparatus for testing

专利名称：Method and apparatus for testing发明人：Yosef Solt,Asaf Idan,Ofer Benjamin,Eli Kurin申请号：US131745申请日：20110607公开号：US088298B1公开日：20140909

专利附图：

摘要：Aspects of the disclosure provide a method for testing. The method includesdetermining an electrical characteristic of an integrated circuit (IC), subjecting the IC to astress test, characterizing the electrical characteristic of the IC subsequently to

subjecting the IC to the stress test, and determining a quality attribute of the IC based on

a comparison of the respective electrical characteristics of the IC before and aftersubjecting the IC to the stress test.

申请人：Yosef Solt,Asaf Idan,Ofer Benjamin,Eli Kurin

地址：Atzmon-Segev IL,Rehovot IL,Haifa IL,Zichron Yaakov IL

国籍：IL,IL,IL,IL

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