专利名称：Devices, systems, and methods for
classifying materials based on a bidirectionalreflectance distribution function
发明人：Siu-Kei Tin申请号：US14149515申请日：20140107公开号：US09367909B2公开日：20160614
专利附图：
摘要：Systems, devices, and methods for classifying a sample by material typemeasure a reflection of a sample at an illumination angle and an observation angle in at
least two spectral bands, calculate a feature value for the sample based on an estimatedratio value of the at least two spectral bands of the measured reflection, and classify thesample based on the feature value.
申请人：CANON KABUSHIKI KAISHA
地址：Tokyo JP
国籍：JP
代理机构：Canon U.S.A., Inc. IP Division
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